Abstract:
This paper aims to present the proposal of a new method for the determination of retroreflective coefficients of microprism films by goniophotometry. For this purpose, a specimen was prepared with the application of a microprismatic retroreflective film on a rigid plate and its positioning was carried out in the geometric reference center for measurements of the goniophotometer by means of a suitable support. A small projector with light beam directed to the retroreflective film was attached to the goniophotometer sensor. At the end the light scatter plot and the luminance of the film surface were obtained. With the values obtained, the retroreflecting coefficients were calculated and the scatter plot of the retroreflecting coefficients was obtained. The results were compared with the conventional method presenting convergence with low deviation. In this way it was demonstrated that the process, with minor corrections, can be used as an alternative to the traditional method.
Reference:
SANCHEZ JÚNIOR, Oswaldo; SILVA, E. S.; VITRO, José Geraldo; BARROS, Kelvis do Nascimento; MOREIRA, Renata Maria Moreira. Characterization of the intensity distribution in retroreflective adhesives with near field goniophotometry. In: INTERNATIONAL COMMISSION ON ILLUMINATION, QUADENNIAL SESSION, CIE, 29., 2019, Washington. Proceedings… 7 p.
Document is password protected, ask Customer Service/Library-DAIT/IPT. Log into BiblioInfo Biblioteca-DAIT/IPT to access the full text in PDF:
https://escriba.ipt.br/pdf_restrito/176432.pdf
This paper aims to present the proposal of a new method for the determination of retroreflective coefficients of microprism films by goniophotometry. For this purpose, a specimen was prepared with the application of a microprismatic retroreflective film on a rigid plate and its positioning was carried out in the geometric reference center for measurements of the goniophotometer by means of a suitable support. A small projector with light beam directed to the retroreflective film was attached to the goniophotometer sensor. At the end the light scatter plot and the luminance of the film surface were obtained. With the values obtained, the retroreflecting coefficients were calculated and the scatter plot of the retroreflecting coefficients was obtained. The results were compared with the conventional method presenting convergence with low deviation. In this way it was demonstrated that the process, with minor corrections, can be used as an alternative to the traditional method.
Reference:
SANCHEZ JÚNIOR, Oswaldo; SILVA, E. S.; VITRO, José Geraldo; BARROS, Kelvis do Nascimento; MOREIRA, Renata Maria Moreira. Characterization of the intensity distribution in retroreflective adhesives with near field goniophotometry. In: INTERNATIONAL COMMISSION ON ILLUMINATION, QUADENNIAL SESSION, CIE, 29., 2019, Washington. Proceedings… 7 p.
Document is password protected, ask Customer Service/Library-DAIT/IPT. Log into BiblioInfo Biblioteca-DAIT/IPT to access the full text in PDF:
https://escriba.ipt.br/pdf_restrito/176432.pdf
