A compilation of patentes to mechanical metrology standards and high-precision measurement of mechanical quantities

Abstract:
The paper aims to provide a source of information regarding the measurement of physical quantities, specifically those related to mechanical metrology. Since there is a lack of literature reviews referencing patents as a way of gathering useful information, we performed a systematic search for patents that could solve practical problems in this field. The methodology used focused on one of the most comprehensive patent database, Orbit.com, covering about 70,000,000 documents. This text gives a quick look at the fundamentals of the measurement literature and then points out the state-of-the-art concerning patents in the area of study. Additionally, data analysis shows the trends in the last five decades of patents about the subject. In total, 5686 documents are found and we compiled 10 examples of relevant patents for the quantities Length, Temperature and Mass, making this article a source of information for both scientific and non-scientific metrology community.


Referência:
LEÃO, Rodrigo Junqueira; CASSALES, Luis Felipe; TUKOFF-GUIMARÃES, Yuri Basile; CASTANHO, Manuel Antônio Pires. A compilation of patentes to mechanical metrology standards and high-precision measurement of mechanical quantities. Measurement, v.94, p.523-530, Dec., 2016. 
Acesso ao artigo no site do ScienceDirect:
http://www.sciencedirect.com/science/journal/02632241/92
 

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