Abstract:
Nanometrology is a part of metrology that deals with the measurements of several quantities at the level of the nanometric scale. With the exponential advancement of nanotechnology in the last decades, a huge effort was required from the National Metrology Laboratories to follow this progress, offering ways to guarantee the metrological traceability demanded by this area. The present article intends to present a picture of the situation of nanometrology in Brazil and in the world through a survey of data made available by the National Metrology Laboratories, the International Bureau of Weights and Measures and by the National System of Laboratories in Nanotechnologies (SisNANO).
Reference:
TORRES, Fabrício Gonçalves. Um panorama da nanometrologia no Brasil e no mundo. Revista IPT Tecnologia e Inovação, v.5, n.16, p.66-85, abr., 2021.
Access to the article on the Journal website:
http://revista.ipt.br/index.php/revistaIPT/article/view/127/148
Nanometrology is a part of metrology that deals with the measurements of several quantities at the level of the nanometric scale. With the exponential advancement of nanotechnology in the last decades, a huge effort was required from the National Metrology Laboratories to follow this progress, offering ways to guarantee the metrological traceability demanded by this area. The present article intends to present a picture of the situation of nanometrology in Brazil and in the world through a survey of data made available by the National Metrology Laboratories, the International Bureau of Weights and Measures and by the National System of Laboratories in Nanotechnologies (SisNANO).
Reference:
TORRES, Fabrício Gonçalves. Um panorama da nanometrologia no Brasil e no mundo. Revista IPT Tecnologia e Inovação, v.5, n.16, p.66-85, abr., 2021.
Access to the article on the Journal website:
http://revista.ipt.br/index.php/revistaIPT/article/view/127/148
