Technical Articles

A compilation of patentes to mechanical metrology standards and high-precision measurement of mechanical quantities

Referência:

LEÃO, Rodrigo Junqueira; CASSALES, Luis Felipe; TUKOFF-GUIMARÃES, Yuri Basile; CASTANHO, Manuel Antônio Pires. A compilation of patentes to mechanical metrology standards and high-precision measurement of mechanical quantities. Measurement, v.94, p.523-530, Dec., 2016.

Acesso ao artigo no site do ScienceDirect:

http://www.sciencedirect.com/science/journal/02632241/92